Aberration-Corrected Imaging in Transmission Electron Microscopy
- Description
- About the Author
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This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.
It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.
The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
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Rolf Erni studied materials science and received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the (formerly) Institute of Applied Physics. Thereafter he carried out postdoctoral studies at the University of California at Davis and at the National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory. He then joined FEI Company as an application specialist and was later in the role of a system engineer. Before returning to NCEM as a staff scientist, he spent a period of time as a faculty member at the EMAT institute (Electron Microscopy for Materials Science) of the University of Antwerp. Since 2009, Rolf is head of Empa's Electron Microscopy Center
Cover Type: Hardcover
Page Count: 348
Year Published: 2010