Skip to content
Free shipping with a min. spend of $50 and above (Singapore only)
Free shipping with a min. spend of $50 and above (Singapore only)

Aberration-Corrected Imaging in Transmission Electron Microscopy (2nd Edition)

By: Rolf Erni

Notify me when back in stock

  • Description
  • About the Author
  • Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts.

    The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration.

    This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

  • Rolf Erni studied materials science and received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the (formerly) Institute of Applied Physics. Thereafter he carried out postdoctoral studies at the University of California at Davis and at the National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory. He then joined FEI Company as an application specialist and was later in the role of a system engineer. Before returning to NCEM as a staff scientist, he spent a period of time as a faculty member at the EMAT institute (Electron Microscopy for Materials Science) of the University of Antwerp. Since 2009, Rolf is head of Empa's Electron Microscopy Center

ISBN: 9781783265282
Cover Type: Hardcover
Page Count: 432
Year Published: 2015